%0 Journal Article
%A Mai K. Nguyen
%A T.Tuong Truong
%T On a generalized X-ray transform and a new method for defect detection using the medium electronic density
%J Comptes Rendus. Mathématique
%D 2003
%P 195-200
%V 336
%N 2
%I Elsevier
%R 10.1016/S1631-073X(03)00010-4
%G en
%F CRMATH_2003__336_2_195_0