TY  - JOUR
AU  - Eric Felder
AU  - Sébastien Roy
AU  - Evelyne Darque-Ceretti
TI  - Characterization of the adhesion of thin film by Cross-Sectional Nanoindentation Analysis of the substrate edge chipping and the film delamination
JO  - Comptes Rendus. Mécanique
PY  - 2011
SP  - 443
EP  - 457
VL  - 339
IS  - 7-8
PB  - Elsevier
DO  - 10.1016/j.crme.2011.05.003
LA  - en
ID  - CRMECA_2011__339_7-8_443_0
ER  -