TY  - JOUR
AU  - Juan Jiménez
TI  - Laser diode reliability: crystal defects and degradation modes
JO  - Comptes Rendus. Physique
PY  - 2003
SP  - 663
EP  - 673
VL  - 4
IS  - 6
PB  - Elsevier
DO  - 10.1016/S1631-0705(03)00097-5
LA  - en
ID  - CRPHYS_2003__4_6_663_0
ER  -