%0 Journal Article
%A Till Hartmut Metzger
%A Tobias Urs Schülli
%A Martin Schmidbauer
%T X-ray methods for strain and composition analysis in self-organized semiconductor nanostructures
%J Comptes Rendus. Physique
%D 2005
%P 47-59
%V 6
%N 1
%I Elsevier
%R 10.1016/j.crhy.2004.11.002
%G en
%F CRPHYS_2005__6_1_47_0