@article{CRPHYS_2008__9_1_95_0,
     author = {Laurent B\'echou and Yves Danto and Jean-Yves Deletage and Fr\'ed\'eric Verdier and Yannick Deshayes and S\'ebastien Fregon\`ese and Cristell Maneux and Thomas Zimmer and Dominique Laffitte},
     title = {Challenges and potential of new approaches for reliability assessment of nanotechnologies},
     journal = {Comptes Rendus. Physique},
     pages = {95--109},
     publisher = {Elsevier},
     volume = {9},
     number = {1},
     year = {2008},
     doi = {10.1016/j.crhy.2007.12.001},
     language = {en},
}