%0 Journal Article
%A Laurent Béchou
%A Yves Danto
%A Jean-Yves Deletage
%A Frédéric Verdier
%A Yannick Deshayes
%A Sébastien Fregonèse
%A Cristell Maneux
%A Thomas Zimmer
%A Dominique Laffitte
%T Challenges and potential of new approaches for reliability assessment of nanotechnologies
%J Comptes Rendus. Physique
%D 2008
%P 95-109
%V 9
%N 1
%I Elsevier
%R 10.1016/j.crhy.2007.12.001
%G en
%F CRPHYS_2008__9_1_95_0