@article{CRPHYS_2016__17_3-4_485_0,
     author = {Thomas Pardoen and Marie-Sth\'ephane Colla and Hosni Idrissi and Behnam Amin-Ahmadi and Binjie Wang and Dominique Schryvers and Umesh K. Bhaskar and Jean-Pierre Raskin},
     title = {A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects},
     journal = {Comptes Rendus. Physique},
     pages = {485--495},
     publisher = {Elsevier},
     volume = {17},
     number = {3-4},
     year = {2016},
     doi = {10.1016/j.crhy.2015.11.005},
     language = {en},
}