%0 Journal Article
%A Thomas Pardoen
%A Marie-Sthéphane Colla
%A Hosni Idrissi
%A Behnam Amin-Ahmadi
%A Binjie Wang
%A Dominique Schryvers
%A Umesh K. Bhaskar
%A Jean-Pierre Raskin
%T A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects
%J Comptes Rendus. Physique
%D 2016
%P 485-495
%V 17
%N 3-4
%I Elsevier
%R 10.1016/j.crhy.2015.11.005
%G en
%F CRPHYS_2016__17_3-4_485_0