Publié le : 2014-02-01
DOI : 10.1016/S1631-0705(14)00019-X

@misc{CRPHYS_2014__15_2-3_IBC_0,
     title = {Editorial {Board}},
     journal = {Comptes Rendus. Physique},
     pages = {IBC},
     publisher = {Elsevier},
     volume = {15},
     number = {2-3},
     year = {2014},
     doi = {10.1016/S1631-0705(14)00019-X},
     language = {en},
}

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LA  - en
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ER  - 

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Editorial Board. Comptes Rendus. Physique, Seeing and measuring with electrons: Transmission Electron Microscopy today and tomorrow, Volume 15 (2014) no. 2-3, p. IBC. doi : 10.1016/S1631-0705(14)00019-X. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/S1631-0705(14)00019-X/