Comptes Rendus
Resonant Inelastic X-ray Scattering: From band mapping to inter-orbital excitations
[Diffusion X Inélastique Résonante]
Comptes Rendus. Physique, Volume 9 (2008) no. 5-6, pp. 537-549.

La diffusion X inélastique résonante, que l'on nomme aussi spectroscopie Raman X résonante lorsqu'elle met en jeu des états de valence et de conduction seuls dans l'état final, est devenue un outil majeur pour l'étude des propriétés électroniques de matériaux complexes. Actuellement la résolution de la technique se limite à quelques centaines de meV mais avec sélectivité chimique et une faible sensibilité aux effets de surface. Des progrès récents en optique X et en techniques de production du rayonnement synchrotron ouvrent de nouvelles perspectives pour cette spectroscopie puissante en améliorant le pouvoir résolvant et l'efficacité instrumentale. Nous présentons brièvement les bases de la méthode et nous l'illustrons au moyen d'exemples sélectionés de la litérature.

Resonant inelastic X-ray scattering (also known as resonant X-ray Raman spectroscopy when only valence and conduction states are involved in the final state excitation) has developed into a major tool for understanding the electronic properties of complex materials. Presently it provides access to electron excitations in the few hundred meV range with element and bulk selectivity. Recent progress in X-ray optics and synchrotron radiation engineering have opened up new perspectives for this powerful technique to improve resolving power and efficiency. We briefly present the basics of the method and illustrate its potential with examples chosen from the literature.

Publié le :
DOI : 10.1016/j.crhy.2007.05.020
Keywords: RIXS, X-ray inelastic scattering, Electron correlations
Mot clés : RIXS, Diffusion X inélastique, Corrélations électroniques
Jan Lüning 1 ; Coryn Frank Hague 1

1 Laboratoire de chimie physique – matière et rayonnement (UMR 7614), université Pierre et Marie Curie, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
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Jan Lüning; Coryn Frank Hague. Resonant Inelastic X-ray Scattering: From band mapping to inter-orbital excitations. Comptes Rendus. Physique, Volume 9 (2008) no. 5-6, pp. 537-549. doi : 10.1016/j.crhy.2007.05.020. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2007.05.020/

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