Application of the quantum Hall effect to resistance metrology

Wilfrid Poirier; Félicien Schopfer; Jérémie Guignard; Olivier Thévenot; Pierre Gournay

doi:10.1016/j.crhy.2011.04.008

Quantum Hall effect / Effet Hall quantique

Application of the quantum Hall effect to resistance metrology
[Application de lʼeffet Hall quantique à la métrologie des résistances]

Wilfrid Poirier ¹ ; Félicien Schopfer ¹ ; Jérémie Guignard ¹ ; Olivier Thévenot ¹ ; Pierre Gournay ¹

¹ Quantum Metrology Group, Laboratoire National de métrologie et dʼEssais, 29, avenue Roger-Hennequin, 78197 Trappes, France

Comptes Rendus. Physique, Quantum Hall Effect and Metrology, Volume 12 (2011) no. 4, pp. 347-368.

Résumé
Abstract

La découverte de lʼeffet Hall quantique (EHQ) a révolutionné la métrologie en fournissant une représentation de lʼunité de résistance, $R_{K}$ , qui peut être reproduite avec une incertitude relative de 10⁻⁹ et est théoriquement reliée seulement à la constante de Planck h et la charge de lʼélectron e. Cette révolution sʼest également appuyée sur le développement de ponts de comparaison de résistances équipés de comparateurs cryogéniques de courants (CCC). Le savoir-faire expérimental en EHQ permet désormais la réalisation dʼétalons de résistance combinant de nombreuses barres de Hall élémentaires en réseaux (QHARS) offrant des valeurs parfaitement quantifiées. Dans le contexte dʼune évolution du Système International (SI) dʼunités fondée sur la fixation de certaines constantes de la physique, la détermination de la constante de von Klitzing $R_{K}$ , qui utilise lʼétalon calculable de capacité de Thompson–Lampard, et la réalisation de tests dʼuniversalité de lʼEHQ plus précis sont essentiels. Enfin, le graphène, nouveau matériau fascinant, pourrait marquer un nouveau tournant de la métrologie des résistances.

The quantum Hall effect (QHE) discovery has revolutionized metrology by providing with a representation of the unit of resistance, $R_{K}$ , that can be reproduced within a relative uncertainty of one part in 10⁹ and is theoretically only linked to Planckʼs constant h and the electron charge e. This breakthrough also results from the development of resistance comparison bridges using cryogenic current comparator (CCC). The QHE experimental know-how now allows the realization of perfectly quantized Quantum Hall Array Resistance Standards (QHARS) by combining a large number of single Hall bars. In the context of an evolution of the Système International (SI) of units by fixing some fundamental constants of physics, the determination of the von Klitzing constant $R_{K}$ through the use of the so-called Thompson–Lampard calculable capacitor and the realization of refined universality tests of the QHE are of prime importance. Finally, the fascinating graphene material might be a new turning point in resistance metrology.

Publié le : 2011-05-01

DOI : 10.1016/j.crhy.2011.04.008

Keywords: Fundamental metrology, Electrical metrology, Quantum Hall effect, Semiconductors, Graphene, Fundamental constants of physics
Mots-clés : Métrologie fondamentale, Métrologie électrique, Effet Hall quantique, Semiconducteurs, Graphène, Constantes fondamentales de la physique

Affiliations des auteurs :

Wilfrid Poirier ¹ ; Félicien Schopfer ¹ ; Jérémie Guignard ¹ ; Olivier Thévenot ¹ ; Pierre Gournay ¹

¹ Quantum Metrology Group, Laboratoire National de métrologie et dʼEssais, 29, avenue Roger-Hennequin, 78197 Trappes, France

@article{CRPHYS_2011__12_4_347_0,
     author = {Wilfrid Poirier and F\'elicien Schopfer and J\'er\'emie Guignard and Olivier Th\'evenot and Pierre Gournay},
     title = {Application of the quantum {Hall} effect to resistance metrology},
     journal = {Comptes Rendus. Physique},
     pages = {347--368},
     publisher = {Elsevier},
     volume = {12},
     number = {4},
     year = {2011},
     doi = {10.1016/j.crhy.2011.04.008},
     language = {en},
}

TY  - JOUR
AU  - Wilfrid Poirier
AU  - Félicien Schopfer
AU  - Jérémie Guignard
AU  - Olivier Thévenot
AU  - Pierre Gournay
TI  - Application of the quantum Hall effect to resistance metrology
JO  - Comptes Rendus. Physique
PY  - 2011
SP  - 347
EP  - 368
VL  - 12
IS  - 4
PB  - Elsevier
DO  - 10.1016/j.crhy.2011.04.008
LA  - en
ID  - CRPHYS_2011__12_4_347_0
ER  -

%0 Journal Article
%A Wilfrid Poirier
%A Félicien Schopfer
%A Jérémie Guignard
%A Olivier Thévenot
%A Pierre Gournay
%T Application of the quantum Hall effect to resistance metrology
%J Comptes Rendus. Physique
%D 2011
%P 347-368
%V 12
%N 4
%I Elsevier
%R 10.1016/j.crhy.2011.04.008
%G en
%F CRPHYS_2011__12_4_347_0

Wilfrid Poirier; Félicien Schopfer; Jérémie Guignard; Olivier Thévenot; Pierre Gournay. Application of the quantum Hall effect to resistance metrology. Comptes Rendus. Physique, Quantum Hall Effect and Metrology, Volume 12 (2011) no. 4, pp. 347-368. doi : 10.1016/j.crhy.2011.04.008. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2011.04.008/

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