Friedel oscillations in graphene-based systems probed by Scanning Tunneling Microscopy

Pierre Mallet; Iván Brihuega; Vladimir Cherkez; Jose Marìa Gómez-Rodríguez; Jean-Yves Veuillen

doi:10.1016/j.crhy.2015.12.013

Condensed matter physics in the 21st century: The legacy of Jacques Friedel

Friedel oscillations in graphene-based systems probed by Scanning Tunneling Microscopy
[Oscillations de Friedel dans les systèmes à base de graphène, sondées par Microscopie à Effet Tunnel]

Pierre Mallet ^1,² ; Iván Brihuega ³ ; Vladimir Cherkez ^1,^2,⁴ ; Jose Marìa Gómez-Rodríguez ³ ; Jean-Yves Veuillen ^1,²

¹ Université Grenoble Alpes, Institut Néel, 38042 Grenoble, France
² CNRS, Institut Néel, 38042 Grenoble, France
³ Departamento de Física de la Materia Condensada, Universidad Autonoma de Madrid, 28049 Madrid, Spain
⁴ LNCMI, CNRS–UJF–UPS–INSA, 25, rue des Martyrs, 38042 Grenoble, France

Comptes Rendus. Physique, Volume 17 (2016) no. 3-4, pp. 294-301.

Résumé
Abstract

Depuis 25 ans, les scientifiques utilisent la microscopie à effet tunnel afin de visualiser dans l'espace direct la réponse d'un gaz d'électron bidimensionnel à des impuretés de taille atomique. L'analyse des oscillations de Friedel générées autour de telles impuretés donne des informations précieuses sur le système 2D : propriétés de diffusion élastique, structure de bande, niveau de dopage et symétrie des états électroniques. Cet article est consacré à l'analyse par microscopie à effet tunnel des oscillations de Friedel dans le graphène, matériau 2D star de cette dernière décennie. En particulier, nous montrons comment cette technique permet d'accéder au pseudospin, un degré de liberté unique propre aux fermions de Dirac du graphène.

For the last 25 years, scientists have demonstrated the capabilities of Scanning Tunneling Microscopy (STM) to visualize in real space the response of a two-dimensional electron gas to atomic-scale impurities. The analysis of the Friedel oscillations surrounding the impurities yields valuable information regarding the elastic scattering properties, the band structure, the doping level and the symmetry of the electronic states in the two-dimensional host system. We will address in this article the use of this technique for probing the electronic properties of graphene, the star two-dimensional compound of the last decade. In particular, we will emphasize how this technique can be pushed up to unravel the electronic pseudospin, a distinctive degree of freedom of graphene's Dirac fermions.

Publié le : 2015-12-18

DOI : 10.1016/j.crhy.2015.12.013

Keywords: Friedel oscillations, Graphene, Dirac fermions, Electronic pseudospin, Scanning tunneling microscopy
Mot clés : Oscillations de Friedel, Graphène, Fermions de Dirac, Pseudospin électronique, Microscope à effet tunnel

Affiliations des auteurs :

Pierre Mallet ^{1, 2} ; Iván Brihuega ³ ; Vladimir Cherkez ^{1, 2, 4} ; Jose Marìa Gómez-Rodríguez ³ ; Jean-Yves Veuillen ^{1, 2}

¹ Université Grenoble Alpes, Institut Néel, 38042 Grenoble, France
² CNRS, Institut Néel, 38042 Grenoble, France
³ Departamento de Física de la Materia Condensada, Universidad Autonoma de Madrid, 28049 Madrid, Spain
⁴ LNCMI, CNRS–UJF–UPS–INSA, 25, rue des Martyrs, 38042 Grenoble, France

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     author = {Pierre Mallet and Iv\'an Brihuega and Vladimir Cherkez and Jose Mar{\`\i}a G\'omez-Rodr{\'\i}guez and Jean-Yves Veuillen},
     title = {Friedel oscillations in graphene-based systems probed by {Scanning} {Tunneling} {Microscopy}},
     journal = {Comptes Rendus. Physique},
     pages = {294--301},
     publisher = {Elsevier},
     volume = {17},
     number = {3-4},
     year = {2016},
     doi = {10.1016/j.crhy.2015.12.013},
     language = {en},
}

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%A Iván Brihuega
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%A Jose Marìa Gómez-Rodríguez
%A Jean-Yves Veuillen
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Pierre Mallet; Iván Brihuega; Vladimir Cherkez; Jose Marìa Gómez-Rodríguez; Jean-Yves Veuillen. Friedel oscillations in graphene-based systems probed by Scanning Tunneling Microscopy. Comptes Rendus. Physique, Volume 17 (2016) no. 3-4, pp. 294-301. doi : 10.1016/j.crhy.2015.12.013. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2015.12.013/

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