A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects

Thomas Pardoen; Marie-Sthéphane Colla; Hosni Idrissi; Behnam Amin-Ahmadi; Binjie Wang; Dominique Schryvers; Umesh K. Bhaskar; Jean-Pierre Raskin

Comptes Rendus. Physique, Volume 17 (2016) p. 485-495