[Sur une transformation de type rayons X généralisée et une nouvelle méthode de détection de défauts utilisant la densité électronique en contrôle non-destructif]
On considère une généralisation de la transformation de type rayons X, qui associe à une fonction
We consider a generalization of the X-ray transform which maps a function
Accepté le :
Publié le :
Mai K. Nguyen 1 ; T.Tuong Truong 2
@article{CRMATH_2003__336_2_195_0, author = {Mai K. Nguyen and T.Tuong Truong}, title = {On a generalized {X-ray} transform and a new method for defect detection using the medium electronic density}, journal = {Comptes Rendus. Math\'ematique}, pages = {195--200}, publisher = {Elsevier}, volume = {336}, number = {2}, year = {2003}, doi = {10.1016/S1631-073X(03)00010-4}, language = {en}, }
TY - JOUR AU - Mai K. Nguyen AU - T.Tuong Truong TI - On a generalized X-ray transform and a new method for defect detection using the medium electronic density JO - Comptes Rendus. Mathématique PY - 2003 SP - 195 EP - 200 VL - 336 IS - 2 PB - Elsevier DO - 10.1016/S1631-073X(03)00010-4 LA - en ID - CRMATH_2003__336_2_195_0 ER -
%0 Journal Article %A Mai K. Nguyen %A T.Tuong Truong %T On a generalized X-ray transform and a new method for defect detection using the medium electronic density %J Comptes Rendus. Mathématique %D 2003 %P 195-200 %V 336 %N 2 %I Elsevier %R 10.1016/S1631-073X(03)00010-4 %G en %F CRMATH_2003__336_2_195_0
Mai K. Nguyen; T.Tuong Truong. On a generalized X-ray transform and a new method for defect detection using the medium electronic density. Comptes Rendus. Mathématique, Volume 336 (2003) no. 2, pp. 195-200. doi : 10.1016/S1631-073X(03)00010-4. https://comptes-rendus.academie-sciences.fr/mathematique/articles/10.1016/S1631-073X(03)00010-4/
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