Publié le : 2014-02-01
DOI : 10.1016/S1631-0705(14)00017-6

@misc{CRPHYS_2014__15_2-3_R3_0,
     title = {Dossier {Sommaire}},
     journal = {Comptes Rendus. Physique},
     pages = {iii--iv},
     year = {2014},
     publisher = {Elsevier},
     volume = {15},
     number = {2-3},
     doi = {10.1016/S1631-0705(14)00017-6},
     language = {en},
}

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PY  - 2014
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EP  - iv
VL  - 15
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PB  - Elsevier
DO  - 10.1016/S1631-0705(14)00017-6
LA  - en
ID  - CRPHYS_2014__15_2-3_R3_0
ER  - 

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Dossier Sommaire. Comptes Rendus. Physique, Seeing and measuring with electrons: Transmission Electron Microscopy today and tomorrow, Volume 15 (2014) no. 2-3, pp. iii-iv. doi: 10.1016/S1631-0705(14)00017-6