Comptes Rendus
no. 2-3
Electron microscopy / Microscopie électronique
Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction
[Voir et mesurer avec un faisceau d'électrons : La microscopie électronique à transmission aujourd'hui et demain – Une introduction]
Christian Colliex1
1 Laboratoire de physique des solides, UMR CNRS 8502, Bldg. 510, Université Paris-Sud, 91405 Orsay, France
Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 101-109.

Ce dossier des Comptes rendus Physique est consacré à une revue des développements méthodologiques et technologiques les plus récents en microscopie électronique, et qui offrent en 2014 à cette génération d'instruments des possibilités tout à fait uniques pour explorer la matière condensée à l'échelle atomique. Ce texte d'introduction a pour but de résumer, pour le lecteur potentiel des chapitres qui suivent, une information de base. Il rappelle donc des généralités sur la conception des colonnes, sur les stratégies d'acquisition du signal, sur la correction des aberrations, sur le pouvoir de résolution, sur les expériences in situ et sur d'autres approches innovantes. Quelques domaines privilégiés d'utilisation présente et future sont identifiés et décrits.

This dossier in Comptes rendus Physique is devoted to the most recent technologies and methodologies in electron microscopy available in 2014, which have provided this instrument with unique capabilities for atomic-level investigations in the domain of materials science. The present introduction provides some basic information required for an easier reading of the following manuscripts. It therefore focuses on column design, signal acquisition strategy, aberration correction, resolving power, in situ experiments and novel approaches, illustrated with a description of a few of their present and future fields of use.

Publié le :
DOI : 10.1016/j.crhy.2014.02.001
Keywords: Transmission electron microscopy, Signal generation and recording, Aberration correction, Nanolaboratory
Mot clés : Microscopie électronique à transmission, Génération et détection des signaux, Correction d'aberrations, Nanolaboratoire
Christian Colliex 1

1 Laboratoire de physique des solides, UMR CNRS 8502, Bldg. 510, Université Paris-Sud, 91405 Orsay, France 
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Christian Colliex. Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 101-109. doi : 10.1016/j.crhy.2014.02.001. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2014.02.001/

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