[Voir en 4D avec des électrons : développement de la microscopie électronique ultra-rapide au Caltech]
Tout au long de ces dix dernières années, le Caltech a consacré un effort permanent au développement d'un projet visionnaire, à savoir la microscopie électronique à 4D, une union des possibilités de la microscopie électronique avec les techniques des temps ultra-courts afin de capturer des images claires de la structure nanométrique des matériaux au cours des différentes étapes de leur transformation. Dans cette contribution, nous présentons une brève revue des possibilités techniques des trois plates-formes de microscopie électronique 4D actuellement opérationnelles au Caltech. Parmi les travaux en cours, nous décrirons plus spécialement les résultats les plus récents obtenus en microscopie électronique photo-induite de champ proche (PINEM), un domaine rendu accessible uniquement par les progrès en microscopie électronique ultra-rapide. Nous terminerons par une revue des diverses applications réalisées à ce jour au Caltech dans le prolongement de leurs sources historiques.
The vision to develop 4D electron microscopy, a union of the capabilities of electron microscopy with ultrafast techniques to capture clearly defined images of the nanoscale structure of a material at each step in the course of its chemical or physical transformations, has been pursued at Caltech for the last decade. In this contribution, we will give a brief overview of the capabilities of three currently active Caltech 4D microscopy laboratories. Ongoing work is illustrated by a description of the most recent application of photon-induced near-field electron microscopy (PINEM), a field made possible only by the development of the 4D ultrafast electron microscopy (UEM). An appendix gives the various applications made so far and the historic roots of the development at Caltech.
Mot clés : Champ proche, PINEM, Marches atomiques, Microscopie électronique
@article{CRPHYS_2014__15_2-3_176_0,
author = {J. Spencer Baskin and Ahmed H. Zewail},
title = {Seeing in {4D} with electrons: {Development} of ultrafast electron microscopy at {Caltech}},
journal = {Comptes Rendus. Physique},
pages = {176--189},
publisher = {Elsevier},
volume = {15},
number = {2-3},
year = {2014},
doi = {10.1016/j.crhy.2013.11.002},
language = {en},
}
TY - JOUR AU - J. Spencer Baskin AU - Ahmed H. Zewail TI - Seeing in 4D with electrons: Development of ultrafast electron microscopy at Caltech JO - Comptes Rendus. Physique PY - 2014 SP - 176 EP - 189 VL - 15 IS - 2-3 PB - Elsevier DO - 10.1016/j.crhy.2013.11.002 LA - en ID - CRPHYS_2014__15_2-3_176_0 ER -
J. Spencer Baskin; Ahmed H. Zewail. Seeing in 4D with electrons: Development of ultrafast electron microscopy at Caltech. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 176-189. doi : 10.1016/j.crhy.2013.11.002. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.11.002/
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