A model for solid-state dewetting of a fully-faceted thin film

Rachel V. Zucker; Gye Hyun Kim; W. Craig Carter; Carl V. Thompson

doi:10.1016/j.crhy.2013.06.005

Trends and perspectives in solid-state wetting / Mouillage solide–solide : tendances et perspectives

A model for solid-state dewetting of a fully-faceted thin film
[Un modèle pour le démouillage solide–solide dʼun film mince complètement facetté]

Rachel V. Zucker ¹ ; Gye Hyun Kim ¹ ; W. Craig Carter ¹ ; Carl V. Thompson ¹

¹ Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA

Comptes Rendus. Physique, Volume 14 (2013) no. 7, pp. 564-577.

Résumé
Abstract

Du fait de leurs rapports dʼaspect extrêmement élevés, la plupart des films fins sont instables et, lorsquʼils sont chauffés, ils démouillent ou sʼagglomèrent pour former des îlots. Ce processus peut se produire à lʼétat solide grâce à la diffusion de surface induite par la capillarité. Un trait caractéristique du processus de démouillage est la rétractation des bords du film, quʼils soient naturels ou structurés, ou autour des trous qui se forment dans le film. Des modèles de rétractation de bords ont été précédemment développés pour des matériaux isotropes et anisotropes avec des surfaces différentiables, mais les effets du facettage dans les matériaux hautement anisotropes sont largement inexplorés. Nous présentons ici un modèle à deux dimensions de la rétractation des bords pour des films minces hautement anisotropes, complètement facettés. Ce modèle montre généralement un bon accord avec les résultats expérimentaux pour la rétractation de films de nickel monocristallins sur MgO. À la fois dans les expériences et le modèle, des fronts se forment lorsque les bords se rétractent. Les effets de lʼajustement de divers paramètres physiques sur le taux de rétractation des bords et la géométrie des bourrelets en évolution ont été explorés en utilisant le modèle. Lʼépaisseur du film, lʼautodiffusivité de surface sur la facette supérieure du front, lʼangle de contact équivalent du film sur le substrat, ainsi que la valeur absolue des énergies de surface se sont révélés être les facteurs qui influencent le plus le taux de rétractation des bords. Dans les modèles isotropes et certains systèmes expérimentaux, des vallées se forment à lʼavant des fronts de rétractation et sʼapprofondissent pour entrer en contact avec le substrat et mener à la rupture du film. Notre modèle suggère que cette forme de rupture ne se produira pas lorsque le front est complètement facetté et que sa surface supérieure est une facette dʼéquilibre. Pourtant, cette rupture du film peut survenir via lʼamincissement de films ainsi que pour des films dont les surfaces supérieures ne forment pas de facettes dʼéquilibre.

Owing to their extremely aspect ratios, most thin films are unstable and when they are heated, they will dewet or agglomerate to form islands. This process can occur in the solid state through capillary-driven surface self-diffusion. A key feature of the dewetting process is the retraction of the edges of the film, either natural edges, patterned edges, or edges where holes have formed. Models of edge retraction have been previously developed for isotropic materials and anisotropic materials with differentiable surfaces, but the effects of faceting in highly anisotropic materials have been largely unexplored. Here, we present a two-dimensional model of edge retraction for highly anisotropic, fully-faceted thin films. This model shows generally good agreement with experimental results for edge retraction of single-crystal Ni films on MgO. In both experiments and the model, rims form as the edges retract. The effects of adjusting various physical parameters on the edge retraction rate and the evolving rim geometry were explored using the model. The film thickness, surface self-diffusivity on the top facet of the rim, the equivalent contact angle of the film on the substrate, and the absolute value of the surface energies were found to be the factors that have the greatest influence on the edge retraction rate. In isotropic models and some experimental systems, valleys form ahead of the retracting rims and deepen to contact the substrate and cause pinch-off. Our model suggests that this form of pinch-off will not occur when the rim is fully faceted and the top surface is an equilibrium facet. However, pinch-off can occur through film thinning and for films with top surfaces that do not form flat equilibrium facets.

Publié le : 2013-08-01

DOI : 10.1016/j.crhy.2013.06.005

Keywords: Thin films, Dewetting, Capillarity, Crystalline, Anisotropic, Solid-state
Mot clés : Films minces, Démouillage, Capillarité, Milieux crystallins, Anisotropie, État solide

Affiliations des auteurs :

Rachel V. Zucker ¹ ; Gye Hyun Kim ¹ ; W. Craig Carter ¹ ; Carl V. Thompson ¹

¹ Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA

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     title = {A model for solid-state dewetting of a fully-faceted thin film},
     journal = {Comptes Rendus. Physique},
     pages = {564--577},
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Rachel V. Zucker; Gye Hyun Kim; W. Craig Carter; Carl V. Thompson. A model for solid-state dewetting of a fully-faceted thin film. Comptes Rendus. Physique, Volume 14 (2013) no. 7, pp. 564-577. doi : 10.1016/j.crhy.2013.06.005. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.06.005/

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