Comptes Rendus
Electron microscopy / Microscopie électronique
Using electron beams to investigate carbonaceous materials
[Apports de la microscopie électronique à l'étude des matériaux carbonés]
Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 241-257.

Cet article présente une brève revue des études réalisées en microscopie électronique sur des matériaux carbonés. Tous les aspects essentiels y sont abordés, depuis la préparation des échantillons jusqu'à l'imagerie et la spectroscopie à très haute résolution spatiale, en passant par les mesures conventionnelles de structure dans l'espace réel et dans l'espace réciproque. Un intérêt plus spécifique est cependant consacré aux développements les plus récents, incluant, d'une part, l'outil, à savoir la microscopie électronique à correction d'aberrations, et, d'autre part, l'objet d'étude le plus étudié aujourd'hui, à savoir la variété allotropique de basse dimension, le graphène.

This paper provides a brief review on electron microscopic studies of carbon materials. We discuss all aspects ranging from sample preparation via basics of the structure and its reciprocal space representation to high-resolution imaging and spectroscopy. Emphasis is given to recent developments, namely aberration-corrected electron microscopy and the newest low-dimensional carbon allotrope, graphene.

Publié le :
DOI : 10.1016/j.crhy.2013.10.011
Keywords: Carbon, Carbon nanotube, Graphene, High-resolution electron microscopy
Mot clés : Carbone, Nanotube de carbone, Graphène, Microscopie électronique à haute résolution

Clemens Mangler 1 ; Jannik C. Meyer 1

1 University of Vienna, Department of Physics, Boltzmanngasse 5, A-1090 Wien, Austria
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Clemens Mangler; Jannik C. Meyer. Using electron beams to investigate carbonaceous materials. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 241-257. doi : 10.1016/j.crhy.2013.10.011. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.10.011/

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