[Voir et mesurer avec un faisceau d'électrons : La microscopie électronique à transmission aujourd'hui et demain – Une introduction]
Ce dossier des Comptes rendus Physique est consacré à une revue des développements méthodologiques et technologiques les plus récents en microscopie électronique, et qui offrent en 2014 à cette génération d'instruments des possibilités tout à fait uniques pour explorer la matière condensée à l'échelle atomique. Ce texte d'introduction a pour but de résumer, pour le lecteur potentiel des chapitres qui suivent, une information de base. Il rappelle donc des généralités sur la conception des colonnes, sur les stratégies d'acquisition du signal, sur la correction des aberrations, sur le pouvoir de résolution, sur les expériences in situ et sur d'autres approches innovantes. Quelques domaines privilégiés d'utilisation présente et future sont identifiés et décrits.
This dossier in Comptes rendus Physique is devoted to the most recent technologies and methodologies in electron microscopy available in 2014, which have provided this instrument with unique capabilities for atomic-level investigations in the domain of materials science. The present introduction provides some basic information required for an easier reading of the following manuscripts. It therefore focuses on column design, signal acquisition strategy, aberration correction, resolving power, in situ experiments and novel approaches, illustrated with a description of a few of their present and future fields of use.
Mot clés : Microscopie électronique à transmission, Génération et détection des signaux, Correction d'aberrations, Nanolaboratoire
Christian Colliex 1
@article{CRPHYS_2014__15_2-3_101_0, author = {Christian Colliex}, title = {Seeing and measuring with electrons: {Transmission} electron microscopy today and tomorrow {\textendash} {An} introduction}, journal = {Comptes Rendus. Physique}, pages = {101--109}, publisher = {Elsevier}, volume = {15}, number = {2-3}, year = {2014}, doi = {10.1016/j.crhy.2014.02.001}, language = {en}, }
TY - JOUR AU - Christian Colliex TI - Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction JO - Comptes Rendus. Physique PY - 2014 SP - 101 EP - 109 VL - 15 IS - 2-3 PB - Elsevier DO - 10.1016/j.crhy.2014.02.001 LA - en ID - CRPHYS_2014__15_2-3_101_0 ER -
Christian Colliex. Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 101-109. doi : 10.1016/j.crhy.2014.02.001. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2014.02.001/
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