Laser diode reliability: crystal defects and degradation modes

Juan Jiménez

doi:10.1016/S1631-0705(03)00097-5

Laser diode reliability: crystal defects and degradation modes
[Fiabilité des diodes laser : défauts cristallins et modes de dégradation]

Présenté par : Guy Laval

Juan Jiménez ¹

¹ Fı́sica de la Materia Condensada, ETS Ingenieros Industriales, 47011 Valladolid, Spain

Comptes Rendus. Physique, semiconductor lasers, Volume 4 (2003) no. 6, pp. 663-673.

Résumé
Abstract

L'analyse de la dégradation est fondamentale pour l'optimisation des diodes lasers de puissance. La dégradation des lasers se présente sous trois modes : rapide, graduelle et catastrophique. Elle peut se produire à l'intérieur de la cavité ou au voisinage des facettes. Chaque mode de dégradation présente sa propre signature et des défauts cristallins différents sont associés à chacun de ces modes. Les principaux mécanismes de dégradation sont analysés en montrant les relations entre les modes de dégradation, les propriétés des matériaux et la structure des lasers.

Degradation analysis is a crucial issue for the improvement of high power laser diodes. Degradation occurs in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet mirrors. Each type of degradation presents its own signature and different crystal defects appear associated with them. The main physical mechanisms responsible for laser degradation are analysed showing the relation between the main degradation modes and the different materials properties of the laser structures.

Reçu le : 2003-01-04
Accepté le : 2003-01-08
Publié le : 2003-07-01

DOI : 10.1016/S1631-0705(03)00097-5

Keywords: Degradation, Catastrophic degradation, Dark line defects, Dark spot defects, Recombination enhanced defect reaction, Dislocation climb, Dislocation glide
Mots-clés : Dégradation, Dégradation catastrophique, Défauts lignes noires, Défauts points noirs, Recombinaison, Montée de dislocations, Glissement de dislocations

Affiliations des auteurs :

Juan Jiménez ¹

¹ Fı́sica de la Materia Condensada, ETS Ingenieros Industriales, 47011 Valladolid, Spain

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Juan Jiménez. Laser diode reliability: crystal defects and degradation modes. Comptes Rendus. Physique, semiconductor lasers, Volume 4 (2003) no. 6, pp. 663-673. doi : 10.1016/S1631-0705(03)00097-5. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/S1631-0705(03)00097-5/

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