Comptes Rendus
Advances in synchrotron hard X-ray based imaging
[Progrès récents en imagerie synchrotron aux rayons X durs]
Comptes Rendus. Physique, Synchrotron x-rays and condensed matter, Volume 9 (2008) no. 5-6, pp. 624-641.

Les sources modernes de rayonnement synchrotron ont permis un développement considérable de l'utilisation des techniques d'imagerie. Des paramètres importants de l'échantillon tels sa densité, composition chimique, état chimique, structure et perfection cristallographique sont cartographiés à deux et, de plus en plus, à trois dimensions. Le développement des nano-sciences exige des efforts pour atteindre une résolution spatiale nanométrique.

Cet article décrit une sélection de techniques d'imagerie et microanalyse utilisant des rayons X durs, qui se sont développées au cours des dernières années, grâce à l'utilisation du haut flux et cohérence des faisceaux synchrotron, tout en exploitant les avancées en optique des rayons X et détecteurs, et les performances accrues des ordinateurs (mémoire, vitesse). Cet article fournit des exemples montrant les possibilités de ces techniques, et de nombreuses références récentes.

Modern synchrotron radiation (SR) sources have dramatically fostered the use of SR-based X-ray imaging. The relevant information such as density, chemical composition, chemical states, structure, and crystallographic perfection is mapped in two, or, increasingly, in three dimensions. The development of nano-science requires pushing spatial resolution down towards the nanoscale.

The present article describes a selection of hard X-ray imaging and microanalysis techniques that emerged over the last few years, by taking advantage of the flux and coherence of the SR beams, as well as exploiting the advances in X-ray optics and detectors, and the increased possibilities of computers (memory, speed). Examples are given to illustrate the opportunities associated with the use of these techniques, and a number of recent references are provided.

Publié le :
DOI : 10.1016/j.crhy.2007.08.003
Keywords: Synchrotron radiation, X-ray imaging
Mots-clés : Rayonnement synchrotron, Imagerie aux rayons X

José Baruchel 1 ; Pierre Bleuet 1 ; Alberto Bravin 1 ; Paola Coan 1 ; Enju Lima 1 ; Anders Madsen 1 ; Wolfgang Ludwig 1 ; Petra Pernot 1 ; Jean Susini 1

1 European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France
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José Baruchel; Pierre Bleuet; Alberto Bravin; Paola Coan; Enju Lima; Anders Madsen; Wolfgang Ludwig; Petra Pernot; Jean Susini. Advances in synchrotron hard X-ray based imaging. Comptes Rendus. Physique, Synchrotron x-rays and condensed matter, Volume 9 (2008) no. 5-6, pp. 624-641. doi : 10.1016/j.crhy.2007.08.003. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2007.08.003/

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  • Francesco Femi Marafatto; Rainer Dähn; Daniel Grolimund; Jörg Göttlicher; Andreas Voegelin Thallium sorption by soil manganese oxides: Insights from synchrotron X-ray micro-analyses on a naturally thallium-rich soil, Geochimica et Cosmochimica Acta, Volume 302 (2021), p. 193 | DOI:10.1016/j.gca.2021.03.011
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  • Serveh Kamrava; Pejman Tahmasebi; Muhammad Sahimi Enhancing images of shale formations by a hybrid stochastic and deep learning algorithm, Neural Networks, Volume 118 (2019), p. 310 | DOI:10.1016/j.neunet.2019.07.009
  • Somya Singh; Hechao Li; Sudhanshu S. Singh; Jason Williams; Tyler Stannard; Xianghui Xiao; Yang Jiao; Nikhilesh Chawla Microstructural characterization and mechanical property prediction of a polymer matrix composite by X-ray synchrotron tomography and spatial correlation functions, SN Applied Sciences, Volume 1 (2019) no. 10 | DOI:10.1007/s42452-019-1310-x
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  • Freddy C. Adams Synchrotron X-Ray Fluorescence ☆, Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2017) | DOI:10.1016/b978-0-12-409547-2.14224-6
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  • Hechao Li; Somya Singh; C. Shashank Kaira; James C.E. Mertens; Jason J. Williams; Nikhilesh Chawla; Yang Jiao Microstructural Quantification and Property Prediction Using Limited X-ray Tomography Data, JOM, Volume 68 (2016) no. 8, p. 2288 | DOI:10.1007/s11837-016-2024-9
  • HECHAO LI; SHASHANK KAIRA; JAMES MERTENS; NIKHILESH CHAWLA; YANG JIAO Accurate stochastic reconstruction of heterogeneous microstructures by limited x‐ray tomographic projections, Journal of Microscopy, Volume 264 (2016) no. 3, p. 339 | DOI:10.1111/jmi.12449
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  • Freddy Adams; Carlo Barbante X-Ray Imaging, Chemical Imaging Analysis, Volume 69 (2015), p. 213 | DOI:10.1016/b978-0-444-63439-9.00006-2
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  • A. Turbin-Orger; P. Babin; E. Boller; L. Chaunier; H. Chiron; G. Della Valle; R. Dendievel; A. L. Réguerre; L. Salvo Growth and setting of gas bubbles in a viscoelastic matrix imaged by X-ray microtomography: the evolution of cellular structures in fermenting wheat flour dough, Soft Matter, Volume 11 (2015) no. 17, p. 3373 | DOI:10.1039/c5sm00100e
  • Rongchang Chen; Ping Liu; Tiqiao Xiao; Lisa X. Xu X‐ray Imaging for Non‐Destructive Microstructure Analysis at SSRF, Advanced Materials, Volume 26 (2014) no. 46, p. 7688 | DOI:10.1002/adma.201402956
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  • En-Yu Guo; Nikhilesh Chawla; Tao Jing; Salvatore Torquato; Yang Jiao Accurate modeling and reconstruction of three-dimensional percolating filamentary microstructures from two-dimensional micrographs via dilation-erosion method, Materials Characterization, Volume 89 (2014), p. 33 | DOI:10.1016/j.matchar.2013.12.011
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  • Irene Zanette; Gheylen Daghfous; Timm Weitkamp; Brigitte Gillet; Dominique Adriaens; Max Langer; Peter Cloetens; Lukas Helfen; Alberto Bravin; Françoise Peyrin; Tilo Baumbach; Jean‐Michel Dischler; Denis Van Loo; Tomas Praet; Marie Poirier‐Quinot; Renaud Boistel Looking Inside Marine Organisms with Magnetic Resonance and X‐ray Imaging, Imaging Marine Life (2013), p. 122 | DOI:10.1002/9783527675418.ch7
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  • Emmanuelle Girardin; Chiara Renghini; Jack Dyson; Vittorio Calbucci; Francesca Moroncini; Gianni Albertini Characterization of Porosity in a Laser Sintered MMCp Using X-Ray Synchrotron Phase Contrast Microtomography, Materials Sciences and Applications, Volume 02 (2011) no. 09, p. 1322 | DOI:10.4236/msa.2011.29180
  • J. J. Williams; N. C. Chapman; V. Jakkali; V. A. Tanna; N. Chawla; X. Xiao; F. De Carlo Characterization of Damage Evolution in SiC Particle Reinforced Al Alloy Matrix Composites by In-Situ X-Ray Synchrotron Tomography, Metallurgical and Materials Transactions A, Volume 42 (2011) no. 10, p. 2999 | DOI:10.1007/s11661-011-0718-8
  • Francesco Basile; Patricia Benito; Simone Bugani; Wout De Nolf; Giuseppe Fornasari; Koen Janssens; Luciano Morselli; Erika Scavetta; Domenica Tonelli; Angelo Vaccari Combined Use of Synchrotron‐Radiation‐Based Imaging Techniques for the Characterization of Structured Catalysts, Advanced Functional Materials, Volume 20 (2010) no. 23, p. 4117 | DOI:10.1002/adfm.201001004
  • John Banhart; András Borbély; Krzysztof Dzieciol; Francisco Garcia-Moreno; Ingo Manke; Nikolay Kardjilov; Anke Rita Kaysser-Pyzalla; Markus Strobl; Wolfgang Treimer X-ray and neutron imaging – Complementary techniques for materials science and engineering, International Journal of Materials Research, Volume 101 (2010) no. 9, p. 1069 | DOI:10.3139/146.110382
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