[Progrès récents en imagerie synchrotron aux rayons X durs]
Les sources modernes de rayonnement synchrotron ont permis un développement considérable de l'utilisation des techniques d'imagerie. Des paramètres importants de l'échantillon tels sa densité, composition chimique, état chimique, structure et perfection cristallographique sont cartographiés à deux et, de plus en plus, à trois dimensions. Le développement des nano-sciences exige des efforts pour atteindre une résolution spatiale nanométrique.
Cet article décrit une sélection de techniques d'imagerie et microanalyse utilisant des rayons X durs, qui se sont développées au cours des dernières années, grâce à l'utilisation du haut flux et cohérence des faisceaux synchrotron, tout en exploitant les avancées en optique des rayons X et détecteurs, et les performances accrues des ordinateurs (mémoire, vitesse). Cet article fournit des exemples montrant les possibilités de ces techniques, et de nombreuses références récentes.
Modern synchrotron radiation (SR) sources have dramatically fostered the use of SR-based X-ray imaging. The relevant information such as density, chemical composition, chemical states, structure, and crystallographic perfection is mapped in two, or, increasingly, in three dimensions. The development of nano-science requires pushing spatial resolution down towards the nanoscale.
The present article describes a selection of hard X-ray imaging and microanalysis techniques that emerged over the last few years, by taking advantage of the flux and coherence of the SR beams, as well as exploiting the advances in X-ray optics and detectors, and the increased possibilities of computers (memory, speed). Examples are given to illustrate the opportunities associated with the use of these techniques, and a number of recent references are provided.
Mots-clés : Rayonnement synchrotron, Imagerie aux rayons X
José Baruchel 1 ; Pierre Bleuet 1 ; Alberto Bravin 1 ; Paola Coan 1 ; Enju Lima 1 ; Anders Madsen 1 ; Wolfgang Ludwig 1 ; Petra Pernot 1 ; Jean Susini 1
@article{CRPHYS_2008__9_5-6_624_0,
author = {Jos\'e Baruchel and Pierre Bleuet and Alberto Bravin and Paola Coan and Enju Lima and Anders Madsen and Wolfgang Ludwig and Petra Pernot and Jean Susini},
title = {Advances in synchrotron hard {X-ray} based imaging},
journal = {Comptes Rendus. Physique},
pages = {624--641},
publisher = {Elsevier},
volume = {9},
number = {5-6},
year = {2008},
doi = {10.1016/j.crhy.2007.08.003},
language = {en},
}
TY - JOUR AU - José Baruchel AU - Pierre Bleuet AU - Alberto Bravin AU - Paola Coan AU - Enju Lima AU - Anders Madsen AU - Wolfgang Ludwig AU - Petra Pernot AU - Jean Susini TI - Advances in synchrotron hard X-ray based imaging JO - Comptes Rendus. Physique PY - 2008 SP - 624 EP - 641 VL - 9 IS - 5-6 PB - Elsevier DO - 10.1016/j.crhy.2007.08.003 LA - en ID - CRPHYS_2008__9_5-6_624_0 ER -
%0 Journal Article %A José Baruchel %A Pierre Bleuet %A Alberto Bravin %A Paola Coan %A Enju Lima %A Anders Madsen %A Wolfgang Ludwig %A Petra Pernot %A Jean Susini %T Advances in synchrotron hard X-ray based imaging %J Comptes Rendus. Physique %D 2008 %P 624-641 %V 9 %N 5-6 %I Elsevier %R 10.1016/j.crhy.2007.08.003 %G en %F CRPHYS_2008__9_5-6_624_0
José Baruchel; Pierre Bleuet; Alberto Bravin; Paola Coan; Enju Lima; Anders Madsen; Wolfgang Ludwig; Petra Pernot; Jean Susini. Advances in synchrotron hard X-ray based imaging. Comptes Rendus. Physique, Synchrotron x-rays and condensed matter, Volume 9 (2008) no. 5-6, pp. 624-641. doi : 10.1016/j.crhy.2007.08.003. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2007.08.003/
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