Comptes Rendus
Use of large scale facilities for research in metallurgy
X-ray line profiles analysis of plastically deformed metals
Comptes Rendus. Physique, Volume 13 (2012) no. 3, pp. 293-306.

The theoretical basis of X-ray line profile analysis and its application to microstructural characterization of plastically deformed metallic alloys is presented. The microstructure is described in terms of coherent domain size, planar fault density, dislocation density and a dislocation arrangement parameter. Two evaluation methods are introduced: the momentum method and the extended Convolutional Multiple Whole Profile fit procedure. Their use is exemplified on plastically deformed single crystals, single grains residing in the bulk of a polycrystal and family of grains making up texture components. The selected examples show the potential of X-ray line profile analysis applied to diffraction patterns recorded with laboratory or synchrotron sources.

Nous présentons la base théorique de lʼanalyse des profils de raie en rayons X, et son application à la caractérisation microstructurale de métaux déformés plastiquement. La microstructure est décrite en termes de taille de domaine cohérent, densité de défauts planaires, densité de dislocations et un paramètre dʼarrangement des dislocations. Nous introduisons deux méthodes dʼanalyse : la méthode des moments, et la méthode étendue dʼajustement par analyse Convolutional Multiple Whole Profile. Nous présentons des exemples dʼutilisation de ces mesures sur la déformation plastique de monocristaux, de monocristaux résidant dans le volume dʼun polycristal, et dans le cas de familles de grains constituant des composantes de texture. Les exemples sélectionnés montrent le potentiel de la technique dʼanalyse du profil de raies obtenues soit par des sources de laboratoire ou par rayonnement synchrotron.

Published online:
DOI: 10.1016/j.crhy.2011.12.004
Keywords: Metals and alloys, X-ray diffraction, Line profile analysis, Dislocation density, Planar faults
Mot clés : Métaux et alliages, Diffraction des rayons X, Analyse des profils de raie, Densité de dislocations, Défauts planaires

András Borbély 1; Tamás Ungár 2

1 SMS Materials Centre and CNRS UMR 5146, École des mines de Saint Etienne, 158, cours Fauriel, 42023 Saint Etienne, France
2 Department of Materials Physics, Eötvös University Budapest, P.O. Box 32, Budapest H-1518, Hungary
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András Borbély; Tamás Ungár. X-ray line profiles analysis of plastically deformed metals. Comptes Rendus. Physique, Volume 13 (2012) no. 3, pp. 293-306. doi : 10.1016/j.crhy.2011.12.004. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2011.12.004/

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