Comptes Rendus

Special issue

Fundamental metrology

Table of contents

Comité de rédaction
p. IFC
Foreword
p. 789-790
Measurement and society

Presented by: Guy Laval

Terence J. Quinn; Jean Kovalevsky
p. 791-797
The international system of units (SI)

Presented by: Guy Laval

Jean Kovalevsky; Terence J. Quinn
p. 799-811
Métrologie fondamentale : unités de base et constantes fondamentales
p. 813-820
Metrology and general relativity

Presented by: Guy Laval

Bernard Guinot
p. 821-828
Advances in atomic fountains
p. 829-843
The optical calcium frequency standards of PTB and NIST
p. 845-855
Fundamental electrical standards and the quantum metrological triangle
p. 857-879
Towards a new kilogram definition based on a fundamental constant
p. 881-892
Metrology of angles in astronomy

Presented by: Guy Laval

Jean Kovalevsky
p. 893-906
Metrology in Chemistry: considerations, approaches and developments on the applicability of methods of ‘higher order’
p. 907-920
Medicine and ionizing radiation: metrology requirements

Presented by: Guy Laval

Jean Chavaudra; Bruno Chauvenet; André Wambersie
p. 921-931
Physics/Solids, fluids: structure
Nanowires with finite radii formed in operating liquid metal ion sources (LMIS)

Presented by: Jacques Friedel

Pierre Joyes; Jean Van de Walle; René-Jean Tarento
p. 933-939
Editorial Board
p. IBC